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Magnesium-Doped Lithium Tantalate Crystal
Magnesium-doped lithium tantalate crystal is a functional crystal material modified by magnesium oxide doping on the basis of lithium tantalate crystal. This product inherits the good piezoelectric, electro-optic, nonlinear optical, and thermal stability properties of lithium tantalate, while further improving resistance to photorefractive damage and reducing the coercive field through MgO doping, making it more suitable for high-power lasers and periodically poled nonlinear optical applications. The product can be provided in X and Z crystal orientations, with standard diameters including 76.2 mm and 100 mm, and supports customization of different thicknesses and related specifications. Through periodic poling, PPMgSLT can be further prepared, suitable for high-power frequency doubling, OPO/OPA, visible light frequency conversion, and research-grade nonlinear optical systems.
Product features:Excellent comprehensive optoelectronic performance;High resistance to photorefractive damage;Suitable for periodic poling processing;Suitable for visible light pump frequency conversion
Part Number:MP-LT-MgO
Application area:Periodically poled nonlinear optics | UV and visible light frequency conversion | Terahertz technology | Electro-optic and scientific research devices
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Standard thickness Surface quality
350 μm, 500 μm, 1000 μm, customizable S/D 20/10

Parameter | Specification |
Material Type | MgO:LiTaO₃ |
MgO Doping Concentration | 8.0 mol% |
Crystal Orientation | X、Z |
Diameter | 76.2 mm、100 mm |
Primary Orientation Flat (OF) | 22 mm ± 2 mm、32 mm ± 2 mm |
Secondary Reference Flat (RF) | 14 mm ± 3 mm |
Thickness | 350 μm, 500 μm, 1000 μm, customizable |
Surface Processing | Double-side polished |
Surface Quality | S/D 20/10 |
Surface Roughness | ≤ 0.3 nm |
Total Thickness Variation | ≤ 10 μm |
Warp | ≤ 3 μm(3 inch) |
Ordinary Refractive Index (No) | 2.1768 ± 0.0001 |
Extraordinary Refractive Index (Ne) | 2.1808 ± 0.0001 |
Refractive Index Test Method | Prism Coupler Method @ 633 nm |
Edge Treatment | Chamfered round edge |
Curie Temperature | 603 ± 1 ℃ |
Internal Quality | Free of stripe/inclusion etc. |
Periodic Poling Processing | Supports PPMgSLT |
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