Overview
IdealPhotonics' Visualized Fiber Optic Endface Scratch-Defect Detection System is an intelligent inspection device based on high-resolution optical imaging and AI analysis. Utilizing a 400x high-definition microscope (0.1μm resolution) and deep learning algorithms (recognition accuracy >99%), it automatically classifies and quantitatively assesses defects such as scratches and contamination on fiber optic connector end faces (e.g., IEC standard levels), significantly improving the quality of optical communication network operation and maintenance.The "Nanometer-Level Defect AI Microscope," through 500x ultra-high-definition imaging (50nm pixel accuracy) and convolutional neural networks (99.9% classification accuracy), achieves millisecond-level automatic classification of end-face scratches (width >0.2μm) and particulate contamination (size >0.5μm) (compliant with IEC61300-3-35 standards). This increases fiber optic link inspection efficiency by 100 times, providing a zero-miss intelligent quality control solution for data center optical module production lines (>5000 ports/day).
Claire Lee
Phone:+86 13032176908
Email:claire@idealphotonics.com
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