Overview
IdealPhotonics' X-ray measurement system is a technology that utilizes the penetrating power of X-rays for non-contact, high-precision imaging and dimensional measurement of the internal structure of objects. It uses a detector to receive attenuated signals and reconstruct two-dimensional/three-dimensional models, and is widely used in industrial CT inspection, electronic packaging, and materials analysis.Parameters such as resolution (μm level, e.g., 0.5μm), energy range (kV level, e.g., 20-225kV), detector dynamic range (16-bit and above), geometric magnification (e.g., 2000X), and reconstruction accuracy (±0.1% voxel) directly determine its internal defect detection capability and dimensional measurement reliability.
Claire Lee
Phone:+86 13032176908
Email:claire@idealphotonics.com
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