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749nm Short-Pass Dichroic Filter
This product is a high-performance short-pass dichroic filter with a cut-off edge wavelength of 749 nm, primarily designed for fluorescence imaging, image-splitting, and spectral separation of visible and near-infrared light. The filter offers excellent transmission over the 400-730 nm band with an average transmittance Tavg > 93%, and provides high reflection over the 770-1100 nm band, thereby directing spectral signals on either side of the cut-off wavelength into different optical paths. Designed for a 45°angle of incidence and featuring optical performance controlled for image-splitting applications, it achieves efficient spectral separation while minimizing reflected wavefront distortion that could affect imaging quality. It is suitable for fluorescence microscopy, multi-channel imaging, machine vision, and research optical systems.
Product features:749 nm cut‑off edge wavelength;High transmission from 400–730 nm with Tavg > 93%;Spectral separation characteristic: short‑wave transmission, long‑wave reflection;Suitable for fluorescence imaging and image‑splitting;Operating angle of incidence: 45 ± 1.5°;Good stability under broadband intense light exposure
Part Number:MP-DF-749
Application area:Fluorescence microscopy | Laser optical systems | Biomedical detection | Research and industrial optics
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Edge Wavelength Transmission Band Reflection Band
749 nm Tavg > 93% 400 – 730 nm 770–1100 nm

Specification | Value |
Transmission Band | Tavg > 93% 400 – 730 nm |
Reflection Band | 770 – 1100 nm |
Edge Steepness | Standard (for Fluorescence) |
Edge Wavelength | 749nm |
Angle of Incidence | 45 ± 1.5 ° |
Cone Half-angle | 2° |
Flatness / RWE Classification | Image-splitting |
Reflected Wavefront Error | < 2λ P-V RWE @ 632.8 |
Clear Aperture | ≥ 80% (elliptical) |
Transverse Dimensions, LxW | 25.2 mm x 35.6 mm |
Filter Thickness, Unmounted | 3.0mm |
Filter Thickness Tolerance, Unmounted | ± 0.1mm |
Surface Quality (Scratch-Dig) | 60-40 |
Filter Effective Index | 1.71 |
Optical Damage Rating | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
Orientation | Reflective surface marked with part-Orient in incoming light |
Spectral Characteristic Curves
Transmittance-Wavelength Spectrum
Optical Density Spectrum
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