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244 nm Ultrasteep Long Pass Filter
The MP-LPF-244 is an ultrasteep long pass filter designed specifically for the 244 nm laser line, primarily used in UV Raman spectroscopy, fluorescence detection, laser spectrum analysis, and other precision ultraviolet optical systems. This filter offers high blocking performance with OD > 6 at 244 nm, and provides an average transmittance greater than 90% over the 247.6–550.4 nm band. With a transition width of only 3 nm, it features an extremely steep spectral edge, effectively suppressing the laser line and Rayleigh scattering while improving the collection of Raman signals close to the laser wavelength. The filter is fabricated on a fused silica substrate and mounted in a 25 mm diameter circular metal ring, making it suitable for research-grade Raman spectrometers, fluorescence spectrometers, and custom optical systems.
Product features:Optimized for 244 nm laser;Blocking depth > OD6 at 244 nm;Typical average blocking depth > OD6 from 195.2 to 244 nm;Average transmittance > 90% from 247.6 to 550.4 nm;Transition width only 3 nm, providing ultrasteep spectral edge;Standard outer diameter 25 mm, clear aperture ≥ 22 mm
Part Number:MP-LPF-244
Application area:244 nm UV Raman spectroscopy systems | Deep-UV Raman detection | UV fluorescence spectroscopy | Semiconductor material analysis | Research-grade UV optical equipment
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Laser Wavelength Transmission Band
244 nm Tavg > 90% 247.6 – 550.4 nm

Specification | Value |
Laser Wavelength | 244 nm |
Transmission Band | Tavg > 90% 247.6 – 550.4 nm |
Blocking Band | OD > 6 244 nm |
Blocking Band | ODavg > 6 195.2 – 244 nm (typical) |
Edge Steepness | 0.008 |
Edge Steepness | 319.2 cm⁻¹ |
Edge Steepness | Ultrasteep (for Raman) |
Edge Steepness | 2.0 |
Edge Wavelength | 246.2 nm |
Transition Width | 3 nm |
Transition Width | 497.8 cm-¹ |
Angle of Incidence | 0 ± 2° |
Cone Half-angle | 5° |
Clear Aperture | ≥ 22 mm |
Transverse Dimensions, Diameter | 25 mm |
Filter Thickness, Mounted | 3.5 mm |
Filter Thickness Tolerance, Mounted | ± 0.1 mm |
Filter Thickness, Unmounted | 2.0 mm |
Filter Thickness Tolerance, Unmounted | ± 0.1 mm |
Surface Quality (Scratch-Dig) | 60-40 |
Filter Effective Index | 2.2 |
Optical Damage Rating | 0.5 J/cm2 @ 266 nm (10 ns pulse width),1 J/ @ 53 cm2 2 nm (10 ns pulse width) |
Orientation | Arrow on ring is preferred direction of propagation of light |
Substrate Type | Fused Silica |
Spectral Characteristic Curves
Transmittance-Wavelength Spectrum
Optical Density Spectrum

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