- Cart
- |
- Personal Center
- |


473 nm Raman Dichroic Beamsplitter
The 473 nm Raman dichroic beamsplitter is a high-performance dichroic filter specifically designed for 473 nm laser-based Raman spectroscopy systems. Operating at a 45°angle of incidence, it efficiently reflects the 473 nm laser line while providing high transmission for Raman scattering signals over the 486.6-1200 nm range, effectively separating the excitation light from the Raman signal. The filter achieves an average transmittance greater than 93% over the 486.6-1200 nm band, and its reflection band covers 350.0-478.0 nm, with stable reflectivity for both s- and p-polarized light over 457.9–478.0 nm, ensuring reliable delivery of the 473 nm laser to the sample path and efficient collection of the longer-wavelength Raman signals to the detector. Manufactured on high-purity fused silica substrates, the filter offers excellent optical homogeneity, low autofluorescence, and high environmental stability. Its surface figure meets the requirements for super-resolution and TIRF microscopy, making it suitable for Raman spectroscopy, microscopic imaging, and precision laser detection systems demanding high wavefront quality, imaging resolution, and optical path stability.
Product features:Specifically designed for 473 nm laser Raman systems;Average transmittance >93% over 486.6–1200 nm;Reflection band covers 350.0–478.0 nm;Stable reflection for both s‑ and p‑polarized light;Low-autofluorescence fused silica substrate
Part Number:MP-RDC-473
Application area:Raman spectrometers | Micro-Raman spectroscopy systems | Fluorescence and spectral imaging | Super-resolution microscopy | Research and laboratory instruments
Add to Cart Request for Quotation Consult Favorite
Edge Wavelength Transmission Band Reflection Band
473 nm Tavg > 93% 486.6 – 1200 nm 457.9–478.0 nm

Specification | Value |
Laser Wavelength | 473nm |
Transmission Band | Tavg > 93% 486.6 – 1200 nm |
Reflection Band | 457.9 – 478.0 nm |
Reflection Band | 350.0 – 457.9 nm |
Reflection Band, p-pol | 439 – 457.9 nm |
Reflection Band, s-pol | 457.9 – 478.0 |
Edge Steepness | Standard (for Raman) |
Edge Wavelength | 484nm |
Angle of Incidence | 45 ° with a shift of 0.35%/° (40 – 50 °) |
Cone Half-angle | 0.5° |
Flatness / RWE Classification | Super-resolution / TIRF |
Clear Aperture | ≥ 80% (elliptical) |
Transverse Dimensions, LxW | 25.2 mm x 35.6 mm |
Surface Quality (Scratch-Dig) | 60-40 |
Filter Effective Index | 2.18 |
Optical Damage Rating | Not tested |
Orientation | Reflective surface has laser dot – Orient in direction of incoming light |
Substrate Type | Fused Silica |
Spectral Characteristic Curves
Transmittance-Wavelength Spectrum
Optical Density Spectrum

--
Request for Quotation
We will reply to all your information about the product in time.
⇪