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875nm Long-Pass Dichroic Filter
The MP-DF-875 is a long-pass dichroic filter specifically designed for a 45° incidence optical path. Manufactured with a high-performance multilayer dielectric coating process, it efficiently reflects light in the 350-857.5 nm band while transmitting light in the 892.5-1600 nm band with an average near-infrared transmittance greater than 93 %. The product features a steep cut-off edge, laser-grade optical quality, low wavefront error, and excellent optical power resistance. It effectively separates visible and near-infrared light and is widely used in fluorescence microscopy, biomedical imaging, laser beam paths, spectroscopy, machine vision, and other precision optical systems.
Product features:875 nm long‑pass design;45° standard operating angle;Near‑infrared transmittance exceeding 93 %;High reflectance in the visible region;Low wavefront error;High optical power resistance
Part Number:MP-DF-875
Application area:Fluorescence microscopy | Bioimaging | Laser systems | Spectrometers | Industrial machine vision
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Edge Wavelength Transmission Band Reflection Band
875 nm 892.5–1600 nm,Tavg >90% 350–857.5 nm

Specification | Value |
Transmission Band | Tavg > 93% 892.5–1600 nm |
Transmission Band, p-pol | Tavg > 90% 892.5–1600 |
Transmission Band, s-pol | Tavg > 90% 892.5–1600 |
Reflection Band | 350 – 857.5 nm |
Edge Steepness | Standard (for Fluorescence) |
Edge Wavelength | 875nm |
Angle of Incidence | 45 ± 1.5 ° |
Cone Half-angle | 2° |
Flatness / RWE Classification | Laser |
Reflected Wavefront Error | < 6λ P-V RWE @ 632.8 |
Clear Aperture | ≥ 80% (elliptical) |
Transverse Dimensions, LxW | 25.2 mm x 35.6 mm |
Filter Thickness, Unmounted | 1.05mm |
Filter Thickness Tolerance, Unmounted | ± 0.05mm |
Surface Quality (Scratch-Dig) | 60-40 |
Filter Effective Index | 1.52 |
Optical Damage Rating | Testing has proven to show no signs of degradation when exposed to at least 6.0 W of power from an unfiltered xenon arc lamp over a 25 mm diameter (corresponding to 1.2 W/cm2) for over 500 hrs. |
Orientation | Reflective surface marked with part-Orient in incoming light |
Spectral Characteristic Curves
Transmittance-Wavelength Spectrum
Optical Density Spectrum

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