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880 nm Short Wave Pass Dichroic Filter
The 880 nm short wave pass dichroic filter is a high-performance dichroic filter designed for fluorescence imaging, super-resolution microscopy, and TIRF (total internal reflection fluorescence) systems. Operating at 45° incidence, it efficiently transmits the visible band of 400-850 nm while reflecting the near-infrared band of 910-1400 nm, combining high transmittance, broad reflection band, good polarization consistency, and excellent dispersion control. Manufactured on fused silica substrates with precision multi-layer dielectric coatings, it is suitable for research and industrial optical systems that demand high imaging quality, wavefront performance, and ultrafast spectral response.
Product features:880 nm standard splitting edge;High transmittance over 400–850 nm;Broadband high reflectance over 910–1400 nm;Stable reflection performance for both s‑ and p‑polarizations;Suitable for super-resolution microscopy and TIRF systems;Fused silica substrate for excellent thermal stability and optical performance
Part Number:MP-SWP-880
Application area:Fluorescence microscopy imaging | Super-resolution microscopy | Femtosecond laser systems | Near-infrared imaging | Scientific research and experimental equipment
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Edge Wavelength Transmission Band Reflection Band
880 nm 400–850 nm,Tavg >90% 910–1400 nm

Specification | Value |
Transmission Band | Tavg > 90% 400 – 850 nm |
Transmission Band | Tavg > 80% 400 – 420 nm |
Transmission Band | Tavg > 90% 420 – 850 nm |
Reflection Band | 910 – 1400 nm |
Reflection Band, p-pol | 910 – 1400 |
Reflection Band, s-pol | 910 – 1400 |
Edge Steepness | Standard (for Fluorescence) |
Edge Wavelength | 880nm |
Angle of Incidence | 45 ± 1.5 ° |
Cone Half-angle | 2° |
Flatness / RWE Classification | Super-resolution / TIRF |
Group Delay Dispersion | ± 1250 fs over 910 - 1225 nm reflection band for S-Pol and P-Pol |
Group Delay Dispersion | ± 500 fs over 1225 - 1400 nm reflection band for S-Pol and P-Pol |
Clear Aperture | ≥ 80% (elliptical) |
Transverse Dimensions, LxW | 25.2 mm x 35.6 mm |
Surface Quality (Scratch-Dig) | 60-40 |
Filter Effective Index | 1.71 |
Optical Damage Rating | 1 J/cm sq. @ 532 nm (10 ns pulse width) |
Orientation | Reflective surface has laser dot – Orient in direction of incoming light |
Substrate Type | Fused Silica |
Spectral Characteristic Curves
Transmittance-Wavelength Spectrum
Optical Density Spectrum
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