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664 nm Ultrasteep Raman Long-Pass Filter
The MP-LPF-664 is a high-performance dielectric thin-film filter specifically designed for 664 nm laser Raman spectroscopy systems. Manufactured on a high-quality fused silica substrate with precision hard‑coated dielectric layers, it provides efficient rejection of the 664 nm laser line while maintaining high transmittance for Raman scattering signals. Featuring an ultra-steep cut-off edge, an extremely high optical density (OD > 6), high pass-band transmittance, and excellent environmental stability, this filter effectively improves the signal-to-noise ratio of Raman spectroscopy systems. It is particularly suitable for low-wavenumber Raman measurements, micro-Raman spectroscopy, laser spectral analysis, and research optical instruments.
Product features:Specifically designed for664 nm Raman laser systems;High transmission: average transmittance > 93%;Laser blocking depth: OD6;Ultra‑steep cut‑off edge, suitable for high‑resolution Raman spectroscopy;Narrow transition band design, effectively improving weak Raman signal collection efficiency;Fused silica substrate with excellent thermal and environmental stability
Part Number:MP-LPF-664
Application area:Raman spectrometers | Laser Raman Imaging Systems | Biomedical Detection | Laser Spectroscopy Analysis | Scientific Research Equipment
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Laser Wavelength Transmission Band
664 nm Tavg > 93 % 672.6–1497.7 nm

Specification | Value |
Laser Wavelength | 664 nm |
Transmission Band | Tavg > 93 % 672.6–1497.7 nm |
Blocking Band | OD > 6 664 nm |
Blocking Band | ODavg > 6 540–664 nm (typical) |
Edge Steepness | 0.5% |
Edge Steepness | 74.9 cm-1 |
Edge Steepness | Ultrasteep (for Raman) |
Edge Steepness | 3.3 |
Edge Wavelength | 668.9 nm |
Transition Width | 6.6 nm |
Transition Width | 149 cm-1 |
Angle of Incidence | 0 ± 2° |
Cone Half-angle | 5° |
Clear Aperture | 22 mm |
Transverse Dimensions, Diameter | 25 mm |
Filter Thickness, Mounted | 3.5 mm |
Filter Thickness Tolerance, Mounted | ± 0.1 mm |
Filter Thickness, Unmounted | 2.0 mm |
Filter Thickness Tolerance, Unmounted | ± 0.1 mm |
Surface Quality (Scratch-Dig) | 60-40 |
Filter Effective Index | 1.81 |
Optical Damage Rating | 0.5 J/cm2 @ 266 nm (10 ns pulse width),1 J/ @ 53 cm2 2 nm (10 ns pulse width) |
Orientation | Arrow on ring is preferred direction of propagation of light |
Substrate Type | Fused Silica |
Spectral Characteristic Curves
Transmittance-Wavelength Spectrum
Optical Density Spectrum

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