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532 nm Ultrasteep Raman Long-Pass Filter
The MP-LPF-532 is an ultra-steep longpass edge filter specifically designed for 532 nm laser Raman spectroscopy systems. Manufactured with a high-quality fused silica substrate and precision dielectric thin-film coating technology, it provides efficient blocking of the 532 nm excitation laser while maintaining high transmission in the Raman scattering signal band. Featuring laser suppression of OD > 6, an ultra-narrow transition region, and excellent cut‑off edge steepness, this filter significantly improves the signal-to-noise ratio in Raman systems. It is suitable for research-grade Raman spectrometers, laser analysis equipment, and high-precision optical inspection systems.
Product features:Specifically designed for 532 nm Raman laser systems;High transmission: average transmittance > 93%;Laser blocking depth: OD6;Ultra‑steep cut‑off edge, suitable for high‑resolution Raman spectroscopy;Narrow transition band design, effectively improving weak Raman signal collection efficiency;Fused silica substrate with excellent thermal and environmental stability
Part Number:MP-LPF-532
Application area:Raman spectrometers | Laser Raman Imaging Systems | Biomedical Detection | Laser Spectroscopy Analysis | Scientific Research Equipment
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Laser Wavelength Transmission Band
532 nm Tavg > 93 % 538.9–1200 nm

Specification | Value |
Laser Wavelength | 532 nm |
Transmission Band | Tavg > 93 % 538.9–1200 nm |
Blocking Band | OD > 6 532 nm |
Blocking Band | ODavg > 6 430 – 532 nm (typical) |
Edge Steepness | 0.5% |
Edge Steepness | 93.5 cm-1 |
Edge Steepness | Ultrasteep (for Raman) |
Edge Steepness | 2.7 |
Edge Wavelength | 536.4 nm |
Transition Width | 5.3 nm |
Transition Width | 186 cm-1 |
Angle of Incidence | 0 ± 2° |
Cone Half-angle | 5° |
Clear Aperture | 22 mm |
Transverse Dimensions, Diameter | 25 mm |
Filter Thickness, Mounted | 3.5 mm |
Filter Thickness Tolerance, Mounted | ± 0.1 mm |
Filter Thickness, Unmounted | 2.0 mm |
Filter Thickness Tolerance, Unmounted | ± 0.1 mm |
Surface Quality (Scratch-Dig) | 60-40 |
Filter Effective Index | 1.8 |
Optical Damage Rating | 0.5 J/cm2 @ 266 nm (10 ns pulse width),1 J/ @ 53 cm2 2 nm (10 ns pulse width) |
Orientation | Arrow on ring is preferred direction of propagation of light |
Substrate Type | Fused Silica |
Spectral Characteristic Curves
Transmittance-Wavelength Spectrum
Optical Density Spectrum

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