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441.6 nm Ultrasteep Raman Long-Pass Filter
The MP-LPF-442 is a high-performance ultra-steep edge long-pass filter specifically designed for 441.6 nm laser Raman spectroscopy systems. Manufactured using high-precision ion-beam sputtering (IBS) multi-layer dielectric coating technology, it provides a blocking depth of >OD6 at the 441.6 nm laser line while maintaining an average transmittance >93% over the 447.3-996.1 nm range. This effectively suppresses Rayleigh scattering and improves both Raman signal collection efficiency and signal-to-noise ratio. Featuring an extremely low Raman cut-off shift, ultra-steep edge, high transmittance, and excellent environmental stability, this filter is widely used in research-grade Raman spectrometers, confocal Raman microscopes, and industrial in-line Raman detection systems.
Product features:Specifically designed for 441.6 nm laser Raman systems;Rayleigh blocking depth > OD6;Ultra‑steep cut‑off edge;Raman shift cut‑off at only 112.7 cm⁻¹;Fused silica substrate – low fluorescence and low stress;High environmental stability for long‑term use
Part Number:MP-LPF-442
Application area:Raman spectrometers | Confocal Raman microscopes | Semiconductor material inspection | Graphene and 2D material research | Scientific
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Laser Wavelength Transmission Band
441.6 nm Tavg > 93 % 447.3–996.1 nm

Specification | Value |
Laser Wavelength | 441.6 nm |
Transmission Band | Tavg > 93 % 447.3–996.1 nm |
Blocking Band | OD > 6 441.6 nm |
Blocking Band | ODavg > 6 356–441.6 nm (typical) |
Edge Steepness | 0.5 % |
Edge Steepness | 112.7 cm-1 |
Edge Steepness | Ultrasteep (for Raman) |
Edge Steepness | 2.2 |
Edge Wavelength | 445 nm |
Transition Width | 4.4 nm |
Transition Width | 224 cm-1 |
Angle of Incidence | 0 ± 2° |
Cone Half-angle | 5° |
Clear Aperture | 22 mm |
Transverse Dimensions, Diameter | 25 mm |
Filter Thickness, Mounted | 3.5 mm |
Filter Thickness Tolerance, Mounted | ± 0.1 mm |
Filter Thickness, Unmounted | 2.0 mm |
Filter Thickness Tolerance, Unmounted | ± 0.1 mm |
Surface Quality (Scratch-Dig) | 60-40 |
Filter Effective Index | 1.86 |
Optical Damage Rating | 0.5 J/cm2 @ 266 nm (10 ns pulse width),1 J/ @ 53 cm2 2 nm (10 ns pulse width) |
Orientation | Arrow on ring is preferred direction of propagation of light |
Substrate Type | Fused Silica |
Spectral Characteristic Curves
Transmittance-Wavelength Spectrum
Optical Density Spectrum

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