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355 nm Ultrasteep Long Pass Filter
The MP-LPF-355 is a high-performance ultra-steep long-pass interference filter specifically designed for 355 nm laser Raman spectroscopy applications. Manufactured on high-quality fused silica substrates with precision multi-layer dielectric coatings, it provides high blocking (OD > 6) at the 355 nm laser wavelength while offering high average transmission (T<sub>avg</sub> > 93%) over the 359.6-800.8 nm spectral range. With an Ultra-steep edge design, the filter has an edge wavelength of 357.8 nm and a transition width of only 3.6 nm (279 cm-1), with an edge steepness of 0.5% / 140.1 cm-1. It effectively suppresses the 355 nm laser line, Rayleigh scattering, and short-wavelength stray light, while efficiently transmitting longer-wavelength Raman scattering signals, thereby improving the detection sensitivity and signal-to-noise ratio of Raman spectroscopy systems. The filter is widely used in 355 nm UV laser Raman spectroscopy, laser spectral analysis, laser-induced fluorescence, UV spectral detection, research instruments, and precision optical systems.
Product features:Specifically designed for 355 nm laser Raman spectroscopy systems;Blocking depth > OD 6 at the 355 nm laser line;Typical average blocking depth OD<sub>avg</sub> > 6 from 200 to 355 nm;Average transmission Tavg > 93% from 359.6 to 800.8 nm;Edge wavelength at 357.8 nm;Transition width of only 3.6 nm
Part Number:MP-LPF-355
Application area:355 nm laser Raman spectroscopy systems | UV Raman spectrometers | Semiconductor material analysis | Plasma spectroscopy diagnostics | Research laboratory equipment
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Laser Wavelength Transmission Band
355nm Tavg > 93% 359.6–800.8 nm

Specification | Value |
Laser Wavelength | 355 nm |
Transmission Band | Tavg > 93% 359.6–800.8 nm |
Blocking Band | OD > 6 355 nm |
Blocking Band | ODavg > 6 200–355 nm (typical) |
Edge Steepness | 140.1 cm-1 |
Edge Steepness | 0.005 |
Edge Steepness | Ultrasteep (for Raman) |
Edge Steepness | 1.8 |
Edge Wavelength | 357.8 nm |
Transition Width | 3.6 nm |
Transition Width | 279 cm-1 |
Angle of Incidence | 0 ± 2° |
Cone Half-angle | 5° |
Clear Aperture | ≥ 22 mm |
Transverse Dimensions, Diameter | 25 mm |
Filter Thickness, Mounted | 3.5 mm |
Filter Thickness Tolerance, Mounted | ± 0.1 mm |
Filter Thickness, Unmounted | 2.0 mm |
Filter Thickness Tolerance, Unmounted | ± 0.1 mm |
Surface Quality (Scratch-Dig) | 60-40 |
Filter Effective Index | 2.04 |
Optical Damage Rating | 0.5 J/cm2 @ 266 nm (10 ns pulse width),1 J/ @ 53 cm2 2 nm (10 ns pulse width) |
Orientation | Arrow on ring is preferred direction of propagation of light |
Substrate Type | Fused Silica |
Spectral Characteristic Curves
Transmittance-Wavelength Spectrum
Optical Density Spectrum

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