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248.6 nm Ultrasteep Long Pass Filter
The MP-LPF-244 is an ultrasteep long pass filter designed specifically for the 244 nm laser line, primarily used in UV Raman spectroscopy, fluorescence detection, laser spectrum analysis, and other precision ultraviolet optical systems. This filter offers high blocking performance with OD > 6 at 244 nm, and provides an average transmittance greater than 90% over the 247.6–550.4 nm band. With a transition width of only 3 nm, it features an extremely steep spectral edge, effectively suppressing the laser line and Rayleigh scattering while improving the collection of Raman signals close to the laser wavelength. The filter is fabricated on a fused silica substrate and mounted in a 25 mm diameter circular metal ring, making it suitable for research-grade Raman spectrometers, fluorescence spectrometers, and custom optical systems.
Product features:Specifically designed for 248.6 nm laser Raman spectroscopy systems;Blocking depth > OD 6 at the 248.6 nm laser line;Typical average blocking depth ODavg > 6 from 202 to 248.6 nm;Average transmission Tavg > 90% from 261 to 560.8 nm; Ultra‑steep spectral edge at 251.1 nm;Transition width of only 5 nm
Part Number:MP-LPF-248
Application area:248.6 nm laser Raman spectroscopy systems | UV Raman spectrometers | UV laser inspection systems | Plasma spectroscopy diagnostics | Research laboratory equipment
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Laser Wavelength Transmission Band
248.6 nm Tavg > 90% 261 – 560.8 nm

Specification | Value |
Laser Wavelength | 248.6nm |
Transmission Band | Tavg > 90% 261 – 560.8 nm |
Blocking Band | OD > 6 248.6 nm |
Blocking Band | ODavg > 6 202 – 248.6 nm (typical) |
Edge Steepness | 319.2 cm-1 |
Edge Steepness | 0.008 |
Edge Steepness | Ultrasteep (for Raman) |
Edge Steepness | 2.0 |
Edge Wavelength | 251.1nm |
Transition Width | 5 nm |
Transition Width | 805 cm-1 |
Angle of Incidence | 0 ± 2° |
Cone Half-angle | 5° |
Clear Aperture | ≥ 22 mm |
Transverse Dimensions, Diameter | 25 mm |
Filter Thickness, Mounted | 3.5 mm |
Filter Thickness Tolerance, Mounted | ± 0.1 mm |
Filter Thickness, Unmounted | 2.0 mm |
Filter Thickness Tolerance, Unmounted | ± 0.1 mm |
Surface Quality (Scratch-Dig) | 60-40 |
Filter Effective Index | 2.24 |
Optical Damage Rating | 0.5 J/cm2 @ 266 nm (10 ns pulse width),1 J/ @ 53 cm2 2 nm (10 ns pulse width) |
Orientation | Arrow on ring is preferred direction of propagation of light |
Substrate Type | Fused Silica |
Spectral Characteristic Curves
Transmittance-Wavelength Spectrum
Optical Density Spectrum

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