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826–854 nm OCT Spectrometer
The 826-854 nm OCT spectrometer is a high-speed, high-resolution spectral detection module designed for SD-OCT (Spectral-Domain Optical Coherence Tomography) systems. Employing a high-efficiency transmission grating and a 2048-pixel high-speed linear array detector, it achieves a spectral resolution of 0.015 nm, an axial measurement depth of 12.9 mm in air, and a full-pixel acquisition rate of up to 61 kHz, with a 1024-pixel binning mode reaching up to 101 kHz. The module features excellent roll-off performance and a compact OEM design, making it suitable for industrial OCT, medical OCT, long-range OCT, 3D imaging, and in-line inspection systems.
Product features:826–854 nm OCT‑dedicated wavelength band;0.015 nm high spectral resolution;High‑speed acquisition;Excellent roll‑off performance
Part Number:MP-OCT-826-854
Application area:Industrial OCT inspection | Medical OCT imaging | 3D / Volume OCT | Internal structure and thickness inspection of transparent and | semi-transparent materials
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Wavelength Range Spectral Resolution
826–854 nm 0.015 nm

Parameter | Specification |
Operating Wavelength | 826–854 nm |
Center Wavelength | Approx. 840 nm |
Spectral Bandwidth | 28 nm |
Spectral Resolution | 0.015 nm (average over full band) |
Maximum Axial Measurement Depth | 12.9 mm (in air) |
OCT Axial Resolution | Approx. 11 μm (in air) |
Numerical Aperture (NA) | 0.13 |
Optical Input | FC/UPC |
Pixel Count | 2048 × 1 pixels |
Pixel Size | 7 μm × 200 μm |
Acquisition Rate at 2048 pixels | 61 kHz |
1024 Pixel Binning | 101 kHz |
Data Interface | MIPI CSI-2 |
ADC | 12-bit RAW |
Operating Temperature | 10–45°C, non-condensing |
Storage Temperature | −10~50°C |
Wavelength Temperature Drift | <0.002 nm/°C |
Product Dimensions | 166 × 138 × 50 mm |
Product Weight | Approx. 1.3 kg |
OCT Roll-off Performance Curve

Grating Efficiency Comparison Curve
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