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795–885 nm OCT Spectrometer
The 795-885 nm OCT spectrometer is a compact, high-speed broadband OCT spectral detection module designed for SD-OCT (Spectral-Domain Optical Coherence Tomography) systems. It covers a wavelength range of 795-885 nm with a 90 nm spectral bandwidth, and incorporates a high-efficiency transmission grating, a 2048-pixel CMOS linear array detector, and a high-speed M-DISB-191 electronic platform. The module provides a maximum measurement depth of 4.0 mm (in air) and a minimum axial resolution of 4.1 μm (in air). Acquisition speed reaches 61 kHz in 2048-pixel mode and up to 101 kHz in 1024-pixel binning mode. With overall dimensions of only 130 × 75 × 36 mm and a weight of approximately 592 g, it is ideally suited for OEM integration into high‑speed, high‑resolution, and compact OCT devices.
Product features:795–885 nm broad spectral range;4.1 μm high axial resolution;High‑speed acquisition;Excellent roll‑off performance
Part Number:MP‑OCT‑795‑885
Application area:Industrial OCT inspection | Medical OCT imaging | 3D / Volume OCT | High-resolution OCT imaging
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Wavelength Range Spectral Resolution
795–885 nm 0.05 nm (as per specifications)

Parameter | Specification |
Operating Wavelength | 795–885 nm |
Spectral Bandwidth | 90 nm |
Spectral Resolution | 0.05 nm |
Maximum Measurement Depth (air/water) | 4.0 / 3.0 mm |
OCT Axial Resolution (air/water) | 4.1 / 3.1 μm |
Numerical Aperture (NA) | 0.13 |
Optical Input | FC/UPC |
Pixel Count | 2048 × 1 pixels |
Pixel Size | 7 × 200 μm |
Acquisition Speed | 61 kHz(2048 pixels) |
High-Speed Mode | 101 kHz(1024 pixels Binning) |
Data Interface | MIPI CSI-2,12-bit RAW |
Wavelength Temperature Drift | <0.002 nm/°C |
Operating Temperature | 10~45°C |
Dimensions | 130 × 75 × 36 mm |
Weight | 592 g |
Dimensional Drawing
Spectrometer MTF Performance Curve
Grating Diffraction Efficiency Curve

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