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LEOI-30 Diffraction Intensity Measurement System - Complete Model
Category: Optical Experiment System  Publish Time: 2014-07-04 17:11 

LEOI-30 Diffraction Intensity Measurement System - Complete Model
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 Part NO. :  DCFBG-series
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LEOI-30 Diffraction Intensity Measurement System - Complete Model

Description
This system can be used to quantitatively investigate diffraction effects. To capture and analyze diffraction patterns, a photocell is used to transform diffraction pattern into current which is displayed by a LED. The intensity distribution of diffraction can be plotted with the numerical data recorded. This experiment can help students understand the wave nature of light and improve their experimental skills.
Feathure
Stable performance with easy operation
LED display with accurate reading
Including He-Ne laser and photodetector with amplifier
Complete system

Application
Fraunhofer Diffraction (Far-field)
a. Fraunhofer diffraction through a single-slit
b. Fraunhofer diffraction through a multi-slit plate
c. Fraunhofer diffraction through a single circular aperture
d. Fraunhofer diffraction through a transmission grating
Fresnel Diffraction (Near-field)
a. Fresnel diffraction through a single-slit
b. Fresnel diffraction through a multi-slit plate
c. Fresnel diffraction through a circular aperture
d. Fresnel diffraction past a straight edge

Part list

Description

Specs/Part#

Qty

Optical Rail

1 m, Black anodized aluminum (LEPO-54-1)

1

Carrier

z axis adjustable (LEPO-54-2)

2

Carrier

z and x axes adjustable (LEPO-54-3)

2

Carrier

z, x and y axes adjustable (LEPO-54-4)

1

Transversal Measurement Stage

Travel: 80 mm, Accuracy: 0.01 mm

1

He-Ne Laser

>1.0 mW (LLL-2)

1

Lens Holder

LEPO-9

2

Plate Holder

LEPO-13

1

White Screen

LEPO-14

1

Adjustable Slit

Continuously adjustable from 0-2 mm (LEPO-42)

1

Laser Holder

LEPO-44

1

Lens

 f '= 6.2, 150 mm

1 each

Multi-slit Plate

2,3,4,5 slits

1

Multi-hole Plate with Holder

Chrome plate, 8 holes, 0.1/0.15/0.2/0.3/0.5/0.7/1/2 mm ( dia)

1

Grating

20 l/mm (with mount)

1

Detector and Amplifier

20 μW-200 mW (LLM-2)

1

Alignment Aperture

 

1


Fraunhofer diffraction of single slit

Fraunhofer diffraction of multiple slits

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